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Free Tutorial - 8051

	CoWare Reduces Design Cost for Complex ARM AMBA Platform Optimization | EEMBC® Opens New CoreMark™ Embedded Processor Benchmark to the Industry . . . last week's e-clips alert for design for test
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FREE guide on the venerable 8051 - tutorials, white papers, top vendors. Just released - March, 2009. Cool news. Even 'intellectual property' - everything and anything on the 8051!

Definition: Design for Test (aka 'Design for Testability' or 'DFT') is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply manufacturing tests for the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no defects that could, otherwise, adversely affect the product’s correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer’s environment. The tests generally are driven by test programs that execute in Automatic Test Equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate the source of the failure. DFT plays an important role in the development of test programs and as an interface for test application and diagnostics. Automatic test pattern generation, or ATPG, is much easier if appropriate DFT rules and suggestions have been implemented. Source: Wikipedia (http://en.wikipedia.org/wiki/Design_for_test)