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book    

Embedded Debugging Methods Revealed: Technical Mysteries for Engineers
This new book manages the unthinkable- it conveys crucial technical information to engineers without boring them to tears! In this unique reference, expert embedded designer Lisa Simone provides the solutions to typical embedded software debugging problems from a fresh new perspective. She introduces a team of engineers who readers will recognize from their own workplaces, and then confronts them with real-world debugging scenarios of...
preview: http://www.amazon.com   date: 3/23/2007

book    

The Debugger's Handbook
For today's programmers, it is impossible to foresee every input, every usage scenario, and every combination of applications that can cause errors when run simultaneously. Given all of these unknowns, writing absolutely bug-free code is unachievable. But it is possible, with the right knowledge, to produce nearly bug-free code and The Debugger's Handbook provides just the right guidance to do it. Focused on the best practices for writing...
preview: http://www.amazon.com   date: 7/1/2006

article    

Multiprocessor debugging challenges
Recognizing the significant impact on time to market which the the task of debugging complex multiprocessing systems presents, vendors are introducing solutions that capitalize on new processor devices with multiple cores and heterogeneous systems based on FPGAs and multiple processors.
preview: http://www.dsp-fpga.com   date: 5/18/2009

article    

Integrated BIST simplifies system design
Awareness of different types of subsystem-level Built-In Self Test (BIST) can simplify the system-level design process in mission-critical applications where system reliability is paramount, and “failure is not an option.” Key BIST benefits include the ability to meet Size, Weight, and Power (SWaP) requirements while increasing Mean Time Between Failure (MTBF) and reducing hardware and software overhead.
preview: http://www.vmecritical.com   date: 4/15/2009

showcase    

Calibre nmDRC
Total cycle time is on the rise due to more complex and larger designs, higher error counts and more verification iterations. Calibre® nmDRC responds to the need for reduced cycle time with revolutionary new capabilities that differentiate Calibre nmDRC substantially from traditional DRC tools including dynamic results visualization, equation-based DRC, direct database access and integrated DFM analysis.
preview: http://www.mentor.com  

showcase    

Tessent
The Mentor Graphics Tessent™ product suite provides comprehensive silicon test and yield analysis solutions that address the challenges of manufacturing test, debug, and yield ramp for today’s SoCs. Built on the foundation of the best-in-class solutions for each test discipline, Tessent brings them together in a powerful test flow that ensures total chip coverage.
preview: http://www.mentor.com  

association    

Nexus 5001 Forum
The Nexus 5001 Forum, formerly known as the Global Embedded Processor Debug Interface Standard Consortium, was formed in April 1998 to define and develop a much-needed embedded processor debug interface standard for embedded control applications.
preview: http://www.nexus5001.org