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View Technical Publication Library
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seminar
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Common Platform Technology Forum 2008
Smaller.
Cheaper.
Better.
Faster...and with lower power.
With little room for error, we continue to require more functionality on smaller geometries.
As scaling is becoming problematic, how does the industry move to 32nm and below? The answer: real innovation in materials science, process technology and manufacturing.
And we want to make sure you get there successfully.
It is a tough road to go alone, and much easier if you can...
preview:
http://www.commonplatform.com
date: 9/30/2008
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seminar
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Introduction to Design for Manufacturability (SC855)
Design for Manufacturability (DfM) means different things to different people: those on the design side of our business see it as the art of reducing dimensional and parametric conservatism while protecting aggressive time to market targets, those on the manufacturing side look to DfM to preserve profitability in light of increasing process complexity.
Regardless of individual motivations, it is clear that DfM will continue to gain...
preview:
http://spie.org
date: 2/26/2008
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seminar
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Manufacturing Software Seminar
These seminars provide a forum for members of the electronic design community to learn about Synopsys’ latest technologies and methodologies.
Attend this FREE Manufacturing Software Seminar to discover the benefits of Synopsys’ Manufacturing solutions.
You’ll learn how recent advances in software accuracy, reduced turn-around-time (TAT) and return-on-investment (ROI) for mask synthesis, mask data preparation, physics-based TCAD and yield...
preview:
http://www.synopsys.com
date: 7/9/2008
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book
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Design for Manufacturability & Concurrent Engineering
This book shows how to design products for all aspects of manufacturability and use multifunctional product development teams and Concurrent Engineering principles to: DESIGN FOR LOW COST.
The book shows how to actually design low-cost products.
Chapters 1, 2,and 9 show how to minimize the 80% of a product’s cost that is committed by the design and hard to remove later.
Chapters 3 and 8 show how to optimize the concept/architecture stage...
preview:
http://www.amazon.com
date: 1/1/2008
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book
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Design for Manufacturability and Yield for Nano-Scale CMOS
In the nano-era of CMOS the design and manufacturing communities are dealing with printing circuit artifacts that are less than half the wavelength of the light source used, with new materials, and with tighter pitch and higher aspect ratio metallurgies.
This reality has resulted in three main manufacturability issues namely printability, planarization, and intra-die variability.
Not addressing the fundamentals causing these three issues at...
preview:
http://www.amazon.com
date: 12/1/2006
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buyers guide
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BestTest Test Directory (Registration Required)
The BestTest Directory - a Test Community web site providing a unique interactive information exchange for registered users FREE of charge: The BestTest Directory knowledge base Test Vendor Directory Test Products and Services Directory Test Dictionary and Glossary Test Publication Section The Calendar of Test Events Job Exchange The BestTest Newsletter - Test Related News twice each month Advertising Opportunities for Test Vendors
preview:
http://www.besttest.com
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personal page
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Design for Manufacturability
General personal website on DFM, not specific to electronics nor integrated circuits.
preview:
http://www.design4manufacturability.com
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