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archive
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Design-for-test Technical Publications
Titles include * Embedded Deterministic Test for Low Cost Manufacturing (ITC 2002) * Reducing Simulation Mismatches in Design-for-Test (DFT) Implementation * TestKompress with EDT Technology: Reducing Time and Expense in Test * Embedded Deterministic Test - DFT Technology for Low-Cost IC Manufacturing Test * Using FastScan Diagnostics to Improve Time-to-Volume
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http://www.mentor.com
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conference
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International Symposium on Quality Electronic Design
ISQED is a premier Design and Design Automation conference, held in technical sponsorship of IEEE EDS, IEEE CPMT, and in cooperation with IEEE CASS, ACM/sigDA.
ISQED is the pioneer and leading conference dealing with design for manufacturability, design for yield, design for reliability, and design for quality issues, front to back.
preview:
http://www.isqed.org
date: 3/16/2009
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organization
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Common Platform
IBM, Chartered Semiconductor Manufacturing and Samsung Electronics have developed a new foundry model for the semiconductor market that offers enhanced flexibility, portability, capacity and resources, while accelerating the rate of technological innovation.
This new model is enabled by the Common Platform, a working relationship between IBM, Chartered and Samsung developed to implement a common process technology across all three companies'...
preview:
http://www.commonplatform.com
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