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book
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Design and Test for Multiple Gbps Communication Devices and Systems
This book deals with the latest and outstanding practical physical layer issues and solutions of high speed communication systems.
Widely ranging topics in different disciplines such as Tx/Rx architecture, EM-modeling, entire-path simulation, system level jitter transfer modeling, jitter measurement with model-based inversion, etc. are discussed in a orderly and comprehensive manner.
Readers will benefit a lot from Dr Li's superior effort...
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date: 11/1/2005
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book
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Design of Systems on a Chip: Design and Test
Second of two volumes addressing the design challenges associated with new generations of the semiconductor technology.
The various chapters are the compilations of tutorials presented at workshops in the recent years by prominent authors from all over the world.
Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip.
In...
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date: 10/3/2006
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Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow
current trend in digital design-the integration of the MATLAB® components Simulink® and Stateflow® for model building, simulations, system testing, and fault detection-allows for better control over the design flow process and, ultimately, for better system results.
Digital Integrated Circuits: Design-for-Test Using Simulink® and Stateflow® illustrates the construction of Simulink models for digital project test benches in certain...
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date: 11/2/2006
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book
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System-on-Chip Test Architectures (Systems on Silicon)
Modern electronics testing has a legacy of more than 40 years.
The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers.
As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today?s overall product cost.
This book is a comprehensive...
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date: 11/16/2007
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book
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VLSI Test Principles and Architectures: Design for Testability
This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals.
The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research.
preview:
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date: 7/7/2006
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